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CN 36

Non-destructive checks

Active

Main committee

Mechanical and metallurgical industries

Scope

Standardization and definition of the various non-destructive tests and controls used in the various industries that use this type of testing, such as, for example, the aeronautics industry, the nuclear industry ...

Facts and digits

5

New projects

321

Published standards

0

Meetings

0

Members

Relation to mirrors committee

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ISO/TC 135/SC 5

Radiographic testing


Originator: ISO
P member from Mar 12, 2019

ISO/TC 135/SC 5

Radiographic testing


Originator: ISO

P member from Mar 12, 2019

ISO/TC 202

Microbeam analysis


Originator: ISO
O member from Mar 12, 2019

ISO/TC 202

Microbeam analysis

Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal. Note: The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.


Originator: ISO

O member from Mar 12, 2019

ISO/TC 202/SC 1

Terminology


Originator: ISO
O member from Mar 12, 2019

ISO/TC 202/SC 1

Terminology


Originator: ISO

O member from Mar 12, 2019

ISO/TC 202/SC 2

Electron probe microanalysis


Originator: ISO
O member from Mar 12, 2019

ISO/TC 202/SC 2

Electron probe microanalysis


Originator: ISO

O member from Mar 12, 2019

ISO/TC 202/SC 3

Analytical electron microscopy


Originator: ISO
O member from Mar 12, 2019

ISO/TC 202/SC 3

Analytical electron microscopy


Originator: ISO

O member from Mar 12, 2019

ISO/TC 202/SC 4

Scanning electron microscopy (SEM)


Originator: ISO
O member from Mar 12, 2019

ISO/TC 202/SC 4

Scanning electron microscopy (SEM)


Originator: ISO

O member from Mar 12, 2019